Electronics

Integrated Circuit Lead Cosmetic Inspection

Deep learning technology helps limit semiconductor defects and improve yield without the use of extensive defect libraries.

IC Lead Cosmetic Inspection

相關產品

VisionPro ViDi Product Tile

VisionPro Deep Learning

深度學習工業圖像分析的圖形化程式設計環境

In-Sight D900

In-Sight D900

採用 In-Sight ViDi 深度學習視覺軟體

Machine vision is used throughout the semiconductor manufacturing process to rigorously monitor quality and catch defects. Manufacturers must be vigilant for scratched, twisted, bent, or missing pins. A chip has such low tolerances for error that any flaw, even the most superficial, is cause for rejection. With so many potential defect types, it is inefficient to program an inspection into a rule-based algorithm. Explicitly searching for all defects is too complicated and time consuming. Deep learning algorithms can help limit semiconductor defects and improve yield without the use of extensive defect libraries.

Get Pricing

Cognex Deep Learning offers a simple solution to identify all anomalous features, even without training on “bad” images. Instead, an engineer uses the defect detection tool to train the software on a sample of “good” images in unsupervised mode. Cognex Deep Learning learns the normal appearance and position of a chip’s leads and pins and characterizes all features that deviate as defective.

康耐視特色產品

取得產品支援與訓練等等

加入 MyCognex

是否有任何疑问?

世界各地的康耐视代表可以随时为您提供支持,满足您的视觉和工业读码需求。

聯絡我們
Loading...