Instrument Cluster Inspection
Vision systems inspect instrument clusters, meet cycle-time requirements
Ensure Proper Alignment and FitUsing Cognex® In-Sight® Micro vision systems for instrument cluster inspection ensures proper alignment and fit. The In-Sight Micro uses a geometric pattern matching algorithm called PatMax® to search for two plastic tabs on each appliqué. If these tabs are obscured, the appliqué is sitting on top of the clip rather than behind it and is not aligned correctly. PatMax software locates each feature despite any part-to-part variation.
Each part is manually loaded onto a test rig by an operator and then removed once the inspection is complete. Results are viewed on a PC monitor and all the results are sent to a factory data collection system used to monitor performance. Any defective parts are manually removed from the rig once the operator has pressed the ‘reject acknowledgement’ key. The vision inspection takes only 500 milliseconds per part so each part can easily be loaded, inspected and unloaded within the lines’ forty second cycle time. Vision inspection of instrument clusters using an In-Sight Micro and PatMax eliminates assembly errors and part recalls.