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  • Automatic Identification for Wafer Traceability

    The intensely competitive global semiconductor industry demands ever more rigorous control of increasingly complex processes in order to maximize tool utilization and production yield; there is zero margin for error. The need to track wafers throughout back-end processing has never been more vital to profitability.

    In-Sight® 1740 series wafer readers help meet this challenge by automatically identifying wafers with extreme reliability to minimize the need for human intervention and prevent tool idle time. Whether installed on new equipment or retrofitted onto existing tools, In-Sight 1740 series readers can make 100% wafer traceability a reality.

    For more than two decades, Cognex wafer ID systems have set the standard for high read rates and reliability, and the In-Sight 1740 series is no exception. In-Sight 1740 series wafer readers may be small, but they’re packed full of performance. Everything needed to achieve high read rates without compromising reliability is provided in a single compact, self-contained system.

    Advanced lighting system

    With 12 modes of built-in, software-controlled, bright and dark field illumination, In-Sight 1740 series readers can image virtually any ID mark. Super-soft marks, ultra-thin coatings sapphire substrates - the In-Sight 1740 series lighting system is up to these challenges, and many more. Plus, as new wafer processes and coatings are developed, In-Sight 1740 series readers can be extended to meet new imaging challenges with specialized lighting powered by the auxiliary light port. 

    Bright field

                     Bright field illumination

     Dark field

                     Dark field illumination

     

     

    Proven reading algorithms

    Even the most effective illumination needs advanced ID algorithms to successfully read OCR, T7 Data Matrix, and barcodes on hard to image wafers. At the heart of the In-Sight 1740 series are Cognex reading algorithms developed based on the experience that only comes from having installed over 31,000 wafer ID systems. These algorithms are proven to the most robust, most reliable in the world on ID marks that have been degraded by edge bead, CMP, scribe-on-die patterns, and other conditions.


    T-7 Close Up

                                        SEMI T7

     

    Image enhancement filters

    The effects of wafer processing can impact ID mark quality to such an extent that they resist reading by even the most advanced lighting system and software algorithms. In-Sight 1740 series readers can overcome these visual degradations using automatic image enhancement filters. In the most severe cases, filters are able turn a read failure into a read success while increasing reliability and eliminating the need for a human intervention.

    without OCR Filter

                                      Without OCR filter

    with OCR filter

                                          With OCR filter

     

    Faster reading performance

    The In-Sight 1740 Series reads 40% faster than its predecessor, the best-selling In-Sight 1720 Series. The extra power can also be used to perform more processor intensive image analysis that delivers exceptionally reliable results without increasing overall read times.