Solar Wafer ID, Silicon Crystal Inspection and PV ID

Manufacturers must monitor quality from incoming materials and wafers through every step of the PV value chain to achieve high-quality, high-yield solar cell production. Cognex leads the way in precision alignment for automated wafer handling, as well as ID solutions for part tracking, genealogy, and process control, as well as inspection for quality management.

Silicon Crystal Inspection

Measure the growth of silicon crystals and provide data to help correlate the relationship between crystal appearance and wafer yield.

Defect Inspection

Detect chipped edges, saw marks, and contour defects.

Wafer Inspection

Check wafers for stains, contamination, and mesh pattern and ensures dimensions to avoid processing warped or flipped wafers.

Wafer and PV Cell Identification

Reliably identify all codes for traceability throughout the production process.

AR Coating Inspection

Inspect anti-reflective (AR) coating thickness and color uniformity.